Dr. Punam Bedi, Department of Computer Science, University of Delhi, India

Title of Talk: Recommender Systems: Challenges and Opportunities


Punam Bedi received her Ph.D. in Computer Science from the Department of Computer Science, University of Delhi, India in 1999 and M.Tech.  in Computer Science from IIT Delhi, India in 1986. She is an Associate Professor in the Department of Computer Science, University of Delhi, India. She has been the Head of the Department of Computer Science, University of Delhi during 2005-2008. She has 30+ years of teaching & research experience and has published 200+ papers in National/International Journals/Conferences. Dr. Bedi is a member of AAAI, senior member of ACM, senior member of IEEE, and life member of Computer Society of India. Her research interests include Web Intelligence, Machine Learning, Soft Computing, Semantic Web, Multi-agent Systems, Information Retrieval, Recommender Systems, Intelligent Software Engineering, Intelligent User Interfaces, Requirement Engineering, Human Computer Interaction (HCI), Trust, Personalization, Digital Image Processing, Steganography and Steganalysis. More details about her can be found at


Talk description: Recommender systems (RSs) are intelligent applications which act as helping guide for users who are overburdened with information, choices and options. Recommender systems assist users to narrow down the choices from the plethora of options available to them, by recommending them the most suitable options. Recommender Systems use the opinions of members of a community to help individuals in that community identify the information most likely to be interesting to them or relevant to their needs.  Collaborative filtering, content based and hybrid recommender systems are the three main categories of RSs discussed in literature. The extent to which users find the recommendations satisfactory is ultimately the key feature of recommender systems. These systems are widely adopted in different application domains such as books, movies, news, restaurants, travel, online shopping to name a few.

The talk will start with a brief introduction to recommender systems, distinguishing them from information retrieval systems. Then main categories of recommender systems and evaluation of recommender systems will be discussed, followed by discussion on various research challenges faced by researchers working in the area of recommender systems. The talk will also include some interesting research problems in recommender systems.


Dr. Usha S Mehta, Professor (EC), Institute of Technology, Nirma University, India

Title of Talk: Testing of ASIC to NoC: Paradigm Shift

Biography: Usha Mehta has done her Ph. D. in the area “Testing of VLSI Design” and is currently working as Professor at Nirma University, Ahmedabad. She has more than 22 years of academic experience which includes industrial experience of five years also. She has one patent on her credit. She has published one book and more than 50 research papers in international journals and conferences. She is the reviewer of VLSI related books from reputed publishers like Tata-Mc Graw Hill and also involved in reviewing research articles from reputed journals from IEEE, Elsevier and Science-Direct. She feels satisfied by her involvement in research guidance to Ph. D. and M. Tech.  students. Her research activity includes the research projects from various organizations like ISRO and GUJCOST. She has successfully organized International Conferences, Symposiums, Seminars, workshops and Training programs for Industry, academia and students. The VDAT-2015 and NUiCONE-2012 are the most successful events coordinated by her as Conference Chairs. She has delivered research talks at various conferences and is being invited for expert lectures for various engineering colleges. She has conducted the tutorials at various International conferences. She has been nominated for “CSI award for Best Research work”, “ISTE award for Best Women Teacher” and “ISTE award for Best Ph.D. thesis” from Institute of Technology, Nirma University. She is a senior member of IEEE and currently holds the position of chair, IEEE WIE Affinity group, Gujarat section. She has contributed a lot to ISTE Faculty chapter and under her coordinatorship, the ISTE faculty Chapter, Nirma University is winning the best faculty chapter continuously from last four years. .

Talk description: Following the Moore’s law, the semiconductor industry has traversed a long way from few of microns to 7 or 5 nm. During this journey, the manufacturing and design fields have evolved a lot. But each new technology window came not only with a large increase in transistor to pin ratio but also with variety of new defects in context of shrinking technology. Hence the testing of chips became more and more crucial in each technology window. New fault models were added which in turn exploded with test data volume. A lot of work was done in test time and test power reduction. Later on, to handle design complexity and short time-to-market, it became increasingly common to use modular design approach in form of SoC. Such SoCs containing IP cores of analog, digital and mixed modules with hidden architecture have further exaggerated the burning issues of testing. To reduce the communication delay, the industry is moving forward to NoC. The testing of NoC has not only to deal with issues of ASIC and SoC testing but also to handle the issues related to network testing. In general, this talk will start with introduction to ASIC testing and ASIC testing challenges. It will explore the various fault models, methods and tools in brief. It will cover SoC and NoC test challenges and a brief intro to evolution of IEEE standards for the same.